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ESD Device Stress Testing

Shila Haque
Issued to
Shila Haque
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Issued on
03/05/2026
Expires on
03/05/2027
Credential ID
08413969fa0b4260bb86921a0a8e57e8
IPFS Hash
QmQ1W9RZNbGjTBnJQd7kQMiboHze9zVXSHgUAWqhvJzCvG
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Credential Description

Shila Haque has been awarded a credential for ESD Device Stress Testing by EOSESD Association Inc on 03/05/2026

Earning Criteria

For earning this credential, requirements are met.
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