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ESD Device Stress Testing

Issued to
Emily Tan
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Issued on
07/27/2026
Expires on
07/26/2027
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QmZQLoxxzm5SdWdJBoLYut3cMsYeMKrU67325cZ85witpT
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Credential Description
Emily Tan has been awarded a credential for ESD Device Stress Testing by EOSESD Association Inc on 07/27/2026
Earning Criteria
For earning this credential, requirements are met.
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